SPATIAL AND SPECTRAL WAVEFRONT ANALYSIS AND MEASUREMENT

Title:

SPATIAL AND SPECTRAL WAVEFRONT ANALYSIS AND MEASUREMENT

Document Type and Number:

WIPO Patent Application WO2001077629

Kind Code:

A3

Abstract:

A method and apparatus for wavefront analysis including obtaining a plurality of differently phase changed transformed wavefronts corresponding to a wavefront being analyzed which has an amplitude and a phase, obtaining a plurality of intensity maps of the plurality of phase changed transformed wavefronts and employing the plurality of intensity maps to obtain an output indicating the amplitude and phase of the wavefront being analyzed.

More Like This:

WO/2023/020230	STANDING WAVE HALF-WAVELENGTH DETERMINING METHOD AND APPARATUS IN OPGW OPTICAL CABLE, DEVICE, STORAGE MEDIUM, AND COMPUTER PROGRAM PRODUCT
JP3665639	Methods and equipment for wave surface detection

Inventors:

ARIELI YOEL (IL)
WOLFLING SHAY (IL)
SHEKEL EYAL (IL)

Application Number:

PCT/IL2001/000335

Publication Date:

March 21, 2002

Filing Date:

April 11, 2001

Export Citation:

Click for automatic bibliography generation Help

Assignee:

NANO OR TECHNOLOGIES INC (US)
ARIELI YOEL (IL)
WOLFLING SHAY (IL)
SHEKEL EYAL (IL)

International Classes:

G01J9/00; G01J9/02; G11B7/005; G11B7/14; G01N21/95; G11B20/10; (IPC1-7): G01J9/00

Foreign References:

EP0555099A1	1993-08-11
US5870191A	1999-02-09
US5159474A	1992-10-27
US5777736A	1998-07-07
US4653921A	1987-03-31
US5235587A	1993-08-10
GB2315700A	1998-02-11

Download PDF:

View/Download PDF PDF Help

Previous Patent: A SYSTEM FOR ROBOTIC CONTROL OF IMAGING DATA HAVING A STEERABLE GIMBAL MOUNTED SPECTRAL SENSOR AND M...

Next Patent: METHOD AND DEVICE FOR NON-INVASIVELY DETERMINING MOISTURE CONTENT AND UNIFORMITY OF SOLID PLANT MATT...