Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
SPECIMEN INSPECTION PLAN MANAGEMENT DEVICE, SPECIMEN INSPECTION PLAN MANAGEMENT SYSTEM, SPECIMEN INSPECTION PLAN MANAGEMENT METHOD AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2019/188800
Kind Code:
A1
Abstract:
Provided are a specimen inspection plan management device, a specimen inspection plan management system, a specimen inspection plan management method, and a program which can manage specimen inspection instigated and executed by a doctor. A specimen inspection plan management device (12), which manages a specimen inspection plan at the time when a specimen inspection is executed using a specimen inspection kit that can be acquired by an examinee outside a hospital, is provided with: an inspection plan acquisition unit (30A) which acquires a specimen inspection plan prepared by the doctor through a hospital system; a transmission information output unit (32A) which outputs, on the basis of the specimen inspection plan, transmission information including a transmission destination of the specimen inspection kit; and an inspection result acquisition unit (30B) which acquires, through a system of an inspection institution that retrieves the specimen inspection kit and executes the specimen inspection, an inspection result of the specimen collected using the specimen inspection kit transmitted based on the transmission information.

Inventors:
KANEKO YASUHISA (JP)
Application Number:
PCT/JP2019/012126
Publication Date:
October 03, 2019
Filing Date:
March 22, 2019
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
FUJIFILM CORP (JP)
International Classes:
G16H10/40; G06Q50/22
Foreign References:
JP2002099616A2002-04-05
JP2002215789A2002-08-02
Attorney, Agent or Firm:
MATSUURA, Kenzo (JP)
Download PDF: