Title:
SPECIMEN OBSERVATION METHOD AND SPECIMEN OBSERVATION DEVICE
Document Type and Number:
WIPO Patent Application WO/2014/132485
Kind Code:
A1
Abstract:
A specimen observation method has an acquisition step for acquiring an electronic image of a specimen and a subtraction step for subtracting the DC component from the electronic image signal. The acquisition step takes place in a bright field observation state, and the electronic image in the subtraction step is acquired in a first prescribed state in which at least the position of the specimen and the focal position of an image-forming optical system are different. In addition, a specimen observation device (1) has a light source (21), an illuminating optical system (22), an image-forming optical system (31), an imaging device (32), and an image processing device (40). The illuminating optical system (22) is disposed so as to irradiate a specimen (S) with the illumination light from the light source (21). The image-forming optical system (31) is disposed so that light from the specimen (S) passes therethrough, and the image-forming optical system (31) forms an optical image of the specimen (S). The imaging device (32) is disposed at the position of the optical image. The image processing device (40) carries out the abovementioned specimen observation method.
Inventors:
SUZUKI YOSHIMASA (JP)
Application Number:
PCT/JP2013/078635
Publication Date:
September 04, 2014
Filing Date:
October 15, 2013
Export Citation:
Assignee:
OLYMPUS CORP (JP)
International Classes:
G02B21/36; H04N5/232
Foreign References:
| JP2009145754A | 2009-07-02 | |||
| JP2005173288A | 2005-06-30 | |||
| JP2004354650A | 2004-12-16 | |||
| JPH08122648A | 1996-05-17 | |||
| JP2005173288A | 2005-06-30 |
Other References:
See also references of EP 2963475A4
Attorney, Agent or Firm:
SAITO, Keisuke et al. (JP)
Keisuke Saito (JP)
Keisuke Saito (JP)
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