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Patent Searching and Data


Title:
SPECIMEN SAMPLING SWAB
Document Type and Number:
WIPO Patent Application WO/2022/190726
Kind Code:
A1
Abstract:
This specimen sampling swab comprises a rod and a specimen sampling part provided on an end section of the rod. The specimen sampling part is a cushioning part which can be deformed by an external pressure, the specimen sampling part having a cushioning section including at least a napped body constituting the surface thereof, wherein the napped body has a base material portion and a hairy body provided in a brush shape on a surface of the base material portion.

Inventors:
IKEGAMI SATOSHI (JP)
INANO KOICHI (JP)
Application Number:
PCT/JP2022/004209
Publication Date:
September 15, 2022
Filing Date:
February 03, 2022
Export Citation:
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Assignee:
DENKA COMPANY LTD (JP)
International Classes:
G01N1/04; G01N1/10
Foreign References:
JP2002263108A2002-09-17
JP2019076060A2019-05-23
JP2013224951A2013-10-31
JP2009058260A2009-03-19
US4707450A1987-11-17
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
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