SPECKLE MEASUREMENT DEVICE AND SPECKLE MEASUREMENT METHOD

Title:

SPECKLE MEASUREMENT DEVICE AND SPECKLE MEASUREMENT METHOD

Document Type and Number:

WIPO Patent Application WO/2017/175470

Kind Code:

A1

Abstract:

[Problem] To improve the accuracy of flow rate measurements and the like that target particles such as red blood cells. [Solution] This speckle measurement device comprises: an imaging unit that captures, as speckle images, images of scattered light returning from an object to be measured when the object to be measured is irradiated with coherent light; and a control unit that factors in movement in the relative positional relationship between the object to be measured and the imaging unit, and determines the measurement region corresponding to the same site of the object to be measured in a plurality of the speckle images captured continuously over time by the imaging unit.

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Inventors:

AIZAWA KOTA (JP)
OKUBO ATSUSHI (JP)
WAKITA YOSHIHIRO (JP)

Application Number:

PCT/JP2017/004344

Publication Date:

October 12, 2017

Filing Date:

February 07, 2017

Export Citation:

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Assignee:

SONY CORP (JP)

International Classes:

A61B5/026; G01B11/00; G01N21/49; G01P5/22

Domestic Patent References:

WO2013049123A1	2013-04-04
WO2012096878A2	2012-07-19
WO2010096453A1	2010-08-26

Foreign References:

JP2003164431A	2003-06-10
JP2015527096A	2015-09-17
US20140357990A1	2014-12-04
JP2010508056A	2010-03-18
JPH10290791A	1998-11-04
JPH02268725A	1990-11-02

Other References: