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Patent Searching and Data


Title:
SPECTRAL ANALYSIS DEVICE, SPECTRAL ANALYSIS METHOD, AND READABLE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2016/157270
Kind Code:
A1
Abstract:
Provided are a spectral analysis device, a spectral analysis method, and a program which are capable of suitably analyzing samples. A spectral analysis device according to an embodiment of the present invention is provided with: a light source (13) for generating light with which a sample including a plurality of substances labelled by a plurality of labelling substances is irradiated; a spectroscope (14) which disperses observation light generated by the sample as a result of the light with which the sample is irradiated; a detector (15) which detects the observation light dispersed by the spectroscope (14), and outputs observation spectral data; and a processing unit (16) which analyzes the plurality of substances included in the sample on the basis of the observation spectral data outputted from the detector (15), and analyzes the substances included in the sample by using a generalized inverse matrix of a matrix having, as elements, reference spectral data set for the plurality of labelling substances and noise component data.

Inventors:
ASOGAWA MINORU (JP)
Application Number:
PCT/JP2015/006225
Publication Date:
October 06, 2016
Filing Date:
December 14, 2015
Export Citation:
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Assignee:
NEC CORP (JP)
International Classes:
G01N21/64; C12M1/00; G01J3/443
Domestic Patent References:
WO2014045481A12014-03-27
Foreign References:
JP2005095581A2005-04-14
JP2005274496A2005-10-06
JP2008051654A2008-03-06
JP2009281933A2009-12-03
JP2013240401A2013-12-05
Attorney, Agent or Firm:
IEIRI, Takeshi (JP)
House ON 健 (JP)
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