SPECTRAL FILTER AND SPECTROMETRY DEVICE

Title:

SPECTRAL FILTER AND SPECTROMETRY DEVICE

Document Type and Number:

WIPO Patent Application WO/2016/158853

Kind Code:

A1

Abstract:

A spectral filter (10) is provided with a long-pass filter (12) and a short-pass filter (13). The long-pass filter (12) has a film thickness gradient GL wherein film thickness increases monotonically in a single direction, and transmits light of a wavelength region longer than a cut-off wavelength WL. The short-pass filter (13) has a film thickness gradient GS wherein film thickness increases monotonically in a single direction, and transmits light of a wavelength region shorter than a cut-off wavelength WS. The long-pass filter (12) and the short-pass filter (13) are overlapped such that the single directions match each other. At the positions in the single directions, a transmittance peak is formed by the cut-off wavelength WL being shorter than the cut-off wavelength WS. The film thickness gradient GL is greater than the film thickness gradient GS.

Inventors:

JIDAI HIDETAKA (JP)
KAWAJI MUNENORI (JP)
MATSUDA RYOJI (JP)

Application Number:

PCT/JP2016/059902

Publication Date:

October 06, 2016

Filing Date:

March 28, 2016

Export Citation:

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Assignee:

KONICA MINOLTA INC (JP)

International Classes:

G02B5/28; G01J3/26; G01J3/36

Foreign References:

JPH02132405A	1990-05-21
JP2009294316A	2009-12-17
JPH0534736A	1993-02-12
US5784507A	1998-07-21

Other References: