Title:
SPECTRAL IMAGE CAPTURING DEVICE AND SPECTRAL IMAGE CAPTURING METHOD
Document Type and Number:
WIPO Patent Application WO/2012/173009
Kind Code:
A1
Abstract:
[Problem] To provide a spectral image capturing device capable of capturing a spectral image formed by light of a uniform wavelength over an entirety of an imaging area.
[Solution] Provided is a spectral image capturing device comprising: a variable wavelength spectral element which varies the wavelength of light transmitted therethrough by varying the distance between the facing surfaces of a pair of optical substrates; a surface-to-surface distance control unit which varies the distance between the facing surfaces by moving at least one of the pair of optical substrates; and an imaging unit having an imaging element for acquiring image information of an image formed by the light transmitted through the variable wavelength spectral element. The imaging element has an imaging area constituted by multiple division areas, the imaging unit has an imaging element control means for causing the imaging element to acquire image information only from one of the division areas that is receiving light in a predetermined wavelength range, and the imaging unit acquires image information over an entirety of the imaging area while the surface-to-surface distance control unit varies the distance between the facing surfaces.
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Inventors:
WATANABE TOSHIAKI (JP)
Application Number:
PCT/JP2012/064392
Publication Date:
December 20, 2012
Filing Date:
June 04, 2012
Export Citation:
Assignee:
OLYMPUS CORP (JP)
WATANABE TOSHIAKI (JP)
WATANABE TOSHIAKI (JP)
International Classes:
G01J3/26
Foreign References:
| JP2005300509A | 2005-10-27 | |||
| JP2005521233A | 2005-07-14 | |||
| JP2007017310A | 2007-01-25 | |||
| JP2010249808A | 2010-11-04 |
Other References:
XIAO-XUAN XU ET AL.: "Research of Image Spectrometer using Linear Variable Interference Filter", SPECTROSCOPY AND SPECTRAL ANALYSIS, vol. 22, no. 5, October 2002 (2002-10-01), pages 713 - 717
ITOH, S.: "High Precision Testing Method for Fabry-Perot Etalon", OPTICAL REVIEW, vol. 8, no. 3, 1 June 2001 (2001-06-01), pages 179 - 183
ITOH, S.: "High Precision Testing Method for Fabry-Perot Etalon", OPTICAL REVIEW, vol. 8, no. 3, 1 June 2001 (2001-06-01), pages 179 - 183
Attorney, Agent or Firm:
SHINOHARA & COMPANY INTERNATIONAL PATENT FIRM (JP)
Patent business corporation Shinohara international patent firm (JP)
Patent business corporation Shinohara international patent firm (JP)
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