Title:
SPECTRAL REFLECTIVITY MEASURING DEVICE AND SPECTRAL REFLECTIVITY MEASURING METHOD
Document Type and Number:
WIPO Patent Application WO/2011/142295
Kind Code:
A1
Abstract:
Disclosed is a spectral reflectivity measuring device (1) provided with a reflection calibration plate (4), a plurality of optical filters (5) for transmitting light with different wavelengths therethrough, an image capturing unit (6), and a calculation processing unit (7). A plurality of images of an object to be measured (3) and the reflection calibration plate (4) are acquired while changing the optical filters (5). In the reflection calibration plate (4), a plurality of reflection calibration sections (4a) having different spectral reflectivities are formed, and the spectral reflectivities of the respective reflection calibration sections (4a) are known. In the calculation processing unit (7), the plurality of images of the object to be measured (3) and the reflection calibration plate (4), which are captured via the respective optical filters (5), are processed, and the spectral reflectivity of the object to be measured (3) is derived by a predetermined calculation.
Inventors:
OHTA Naoya (5-1 Tenjin-cho 1-chome, Kiryu-sh, Gunma 15, 〒3768515, JP)
Application Number:
JP2011/060575
Publication Date:
November 17, 2011
Filing Date:
May 06, 2011
Export Citation:
Assignee:
National University Corporation Gunma University (2 Aramaki-machi 4-chome, Maebashi-shi Gunma, 10, 〒3718510, JP)
国立大学法人群馬大学 (〒10 群馬県前橋市荒牧町四丁目２番地 Gunma, 〒3718510, JP)
国立大学法人群馬大学 (〒10 群馬県前橋市荒牧町四丁目２番地 Gunma, 〒3718510, JP)
International Classes:
G01N21/27; G01J3/28
Attorney, Agent or Firm:
Shin-yu International Patent Firm (Sasazuka South Bldg, 1-64-8 Sasazuka, Shibuya-k, Tokyo 73, 〒1510073, JP)
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