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Patent Searching and Data


Title:
SPECTROMETER, AND SPECTROMETER PRODUCTION METHOD
Document Type and Number:
WIPO Patent Application WO/2015/119094
Kind Code:
A1
Abstract:
This spectrometer (1A) is provided with: a light-detection element (20) in which a light-transmission unit (21), a first light-detection unit (22), and second light-detection units (26) are provided; a support body (30) fixed to the light-detection element (20) such that a space (S) is formed; a first reflection unit (11) which is provided to the support body (30), and which reflects light (L1) in the space (S), said light (L1) having been transmitted through the light-transmission unit (21); a second reflection unit (12A) which is provided to the light-detection element (20), and which reflects the light (L1) in the space (S), said light (L1) having been reflected by the first reflection unit (11); and a light-dispersion unit (40A) which is provided to the support body (30), and which disperses and reflects, into the first light-detection unit (22), the light (L1) in the space (S), said light (L1) having been reflected by the second reflection unit (12A). The plurality of second light-detection units (26) are disposed in an area surrounding the second reflection unit (12A).

Inventors:
YOKINO TAKAFUMI (JP)
SHIBAYAMA KATSUMI (JP)
Application Number:
PCT/JP2015/052926
Publication Date:
August 13, 2015
Filing Date:
February 03, 2015
Export Citation:
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Assignee:
HAMAMATSU PHOTONICS KK (JP)
International Classes:
G01J3/02; G01J3/18; G01J3/36
Foreign References:
US20090262346A12009-10-22
JP2004241084A2004-08-26
Other References:
See also references of EP 3104144A4
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
Yoshiki Hasegawa (JP)
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