Title:
SPECTROMETRY DEVICE, AND SPECTROMETRY METHOD
Document Type and Number:
WIPO Patent Application WO/2024/053243
Kind Code:
A1
Abstract:
An analyzing unit of this spectrometry device uses a first correction factor to correct a first electrical signal such that a linearity characteristic of a first amplifier matches a reference linearity characteristic. The analyzing unit uses a second correction factor to correct a second electrical signal such that a linearity characteristic of a second amplifier matches the reference linearity characteristic. The analyzing unit generates first spectrum data on the basis of the corrected first electrical signal, and generates second spectrum data on the basis of the corrected second electrical signal. The analyzing unit generates spectrum data of light to be measured, on the basis of the first spectrum data and the second spectrum data.
Inventors:
OHTSUKA KENICHI (JP)
HOSOKAWA KIYOTADA (JP)
MASUOKA HIDEKI (JP)
TAKAHASHI TERUO (JP)
HOSOKAWA KIYOTADA (JP)
MASUOKA HIDEKI (JP)
TAKAHASHI TERUO (JP)
Application Number:
PCT/JP2023/025769
Publication Date:
March 14, 2024
Filing Date:
July 12, 2023
Export Citation:
Assignee:
HAMAMATSU PHOTONICS KK (JP)
International Classes:
G01J3/02; G01J3/18
Domestic Patent References:
| WO2016129033A1 | 2016-08-18 |
Foreign References:
| JP2020118477A | 2020-08-06 | |||
| JP2005156242A | 2005-06-16 | |||
| JP2012242175A | 2012-12-10 |
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
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