Title:
SPECTROSCOPE, WAVELENGTH MEASURING DEVICE, AND SPECTRUM MEASURING METHOD
Document Type and Number:
WIPO Patent Application WO/2018/012351
Kind Code:
A1
Abstract:
A spectroscope (100, 200) which measures a spectrum of input light is provided with: a stripe former which forms first stripes having a first pitch by splitting the input light; a diffraction grating (103) which disperses the first stripes; a moiré former which forms a moiré by overlapping the dispersed first stripes with second stripes having a second pitch that is different from the first pitch; and an image capturing element (107) which measures the spectrum of the input light by detecting the moiré. At least one of the stripe former and the moiré former includes a cylindrical lens array (101, 205).
Inventors:
KONISHI TSUYOSHI (JP)
Application Number:
PCT/JP2017/024479
Publication Date:
January 18, 2018
Filing Date:
July 04, 2017
Export Citation:
Assignee:
UNIV OSAKA (JP)
International Classes:
G01J3/45; G01J3/04; G01J9/02
Foreign References:
| JP2016057224A | 2016-04-21 | |||
| JPH07248468A | 1995-09-26 | |||
| JPH0915549A | 1997-01-17 | |||
| JPH07322367A | 1995-12-08 | |||
| JP2013050441A | 2013-03-14 | |||
| US5835217A | 1998-11-10 | |||
| JP2016057224A | 2016-04-21 |
Other References:
A. LIVNAT; O. KAFRI: "OPTICS LETTERS", vol. 7, June 1982, OPTICAL SOCIETY OF AMERICA, article "Moire pattern of a linear grid with a lenticular grating", pages: 253 - 255
See also references of EP 3483573A4
See also references of EP 3483573A4
Attorney, Agent or Firm:
NII, Hiromori (JP)
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