SPECTROSCOPIC ANALYSIS DEVICE AND SPECTROSCOPIC ANALYSIS METHOD

WIPO Patent Application WO/2015/122237

A1

Provided are a spectroscopic analysis device and spectroscopic analysis method that facilitate device simplicity and are capable of enhancing measurement accuracy. The present invention is provided with a broadband light source (1) for emitting measurement light (L); a light sensor (7) for receiving a sample-emitted light beam (Ls') emitted from a sample (S) as a result of the irradiation of a sample light beam (Ls) onto the sample and a reference light beam (Lr) and detecting a sample light amount spectrum and a reference light amount spectrum; a sector mirror (2) for selecting and causing the light sensor (7) to receive light to be detected; and a light absorption computation unit (8) for detecting a first reference light amount spectrum and second reference light amount spectrum before and after the detection of the sample light amount spectrum, calculating, from the first reference light amount spectrum and second reference light amount spectrum, an estimated light amount spectrum corresponding to the estimated light amount of the sample light beam (Ls) irradiated onto the sample (S) at the time of the detection of the sample light amount spectrum, and determining the absorbance spectrum of the sample (S) from the sample light amount spectrum and estimated light amount spectrum.

MORISHIMA TETSU (JP)
FUJIMOTO MIYOKO (JP)
FUJITA HAYATO (JP)

PCT/JP2015/051166

August 20, 2015

January 19, 2015

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SUMITOMO ELECTRIC INDUSTRIES (JP)

G01J3/08; G01J3/42; G01N21/359

JPS59147229A	1984-08-23
JPS62157536A	1987-07-13
JP2000193587A	2000-07-14
JP2003287496A	2003-10-10
JPS5948627A	1984-03-19
JPS55167148U	1980-12-01

NAKATA, Motomi et al. (JP)
Nakada Motoki (JP)

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