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Title:
SPECTROSCOPIC ANALYZER
Document Type and Number:
WIPO Patent Application WO/2019/111800
Kind Code:
A1
Abstract:
The present invention is provided with: a light source that emits light including a plurality of wavelength components; a polarizer that converts the light emitted from the light source to linearly polarized light for irradiating a specimen; a polarization diffraction element that diffracts, in a first direction, a first polarization component included in the light that has passed through the specimen to perform wavelength dispersion, and diffracts, in a second direction different from the first direction, a second polarization component to perform wavelength dispersion; a prism disposed on the emission side of the polarization diffraction element, the prism having a first emission plane that intersects the first direction and a second emission plane that intersects the second direction, and the prism being such that the angles of the first emission plane and second emission plane with respect to a reference plane that includes the first direction and the second direction are different from each other; an imaging element that captures an image of the first polarization component emitted from the first emission plane of the prism and an image of the second polarization component emitted from the second emission plane; and a processing device that analyzes the specimen on the basis of the result of imaging by the imaging element.

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Inventors:
MURAYAMA KODAI (JP)
ITO ATSUSHI (JP)
WATANABE FUMIE (JP)
Application Number:
PCT/JP2018/044026
Publication Date:
June 13, 2019
Filing Date:
November 29, 2018
Export Citation:
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Assignee:
YOKOGAWA ELECTRIC CORP (JP)
International Classes:
G01N21/19; G01J3/447; G01N21/21
Domestic Patent References:
WO2016000001A12016-01-07
WO2008142723A22008-11-27
Foreign References:
US20170003169A12017-01-05
JP2012078200A2012-04-19
US20120268745A12012-10-25
US20160031567A12016-02-04
Other References:
CLEMENTINA PROVENZANOPASQUALE PAGLIUSIALFREDO MAZZULLAGABRIELLA CIPPARRONE: "Method for artifact-free circular dichroism measurements based on polarization grating", OPTICS LETTERS, vol. 35, no. 11, 2010, pages 1822 - 1824, XP001554372, DOI: 10.1364/OL.35.001822
See also references of EP 3722787A4
Attorney, Agent or Firm:
TANAI Sumio et al. (JP)
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