Title:
SPECTROSCOPIC CHARACTERISTIC MEASUREMENT DEVICE, SPECTROSCOPIC CHARACTERISTIC MEASUREMENT METHOD, AND FURNACE CONTROL METHOD
Document Type and Number:
WIPO Patent Application WO/2019/168141
Kind Code:
A1
Abstract:
A spectroscopic characteristic measurement device 1 according to an embodiment of the present invention comprises: an imaging spectroscopic device 4 that acquires light emitted from a linear region of an object A or reflected light from the linear region as spectral information; a two-dimensional imaging device 6 that captures an image of a two-dimensional region containing the linear area on the object A; and an arithmetic device 7 that determines, on the basis of the image captured by the two-dimensional imaging device 6, the range in which the imaging spectroscopic device 4 acquires the spectral information.
Inventors:
KODAMA TOSHIFUMI (JP)
AMANO SHOTA (JP)
TAKAHASHI YUKIO (JP)
AMANO SHOTA (JP)
TAKAHASHI YUKIO (JP)
Application Number:
PCT/JP2019/007983
Publication Date:
September 06, 2019
Filing Date:
March 01, 2019
Export Citation:
Assignee:
JFE STEEL CORP (JP)
International Classes:
G01J3/36
Foreign References:
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| JP2009068995A | 2009-04-02 | |||
| JP2017522666A | 2017-08-10 | |||
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| JP2016145405A | 2016-08-12 | |||
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Other References:
"the hyperspectral camera equipped with a spectral filter", 15 January 2018, DAITRON CO., LTD.
See also references of EP 3760991A4
See also references of EP 3760991A4
Attorney, Agent or Firm:
SAKAI INTERNATIONAL PATENT OFFICE (JP)
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