Title:
SPECTROSCOPIC DIAGNOSTIC METHODS AND SYSTEM
Document Type and Number:
WIPO Patent Application WO2003062799
Kind Code:
A3
Abstract:
The present invention provides systems and methods for the determination of the physical characteristics of a structured superficial layer of material using light scattering spectroscopy. The light scattering spectroscopy system comprises optical probes that can be used with existing endoscopes without modification to the endoscope itself. The system uses a combination of optical and computational methods to detect physical characteristics such as the size distribution of cell nuclei in epithelial layers of organs. The light scattering spectroscopy system can be used alone, or in conjunction with other techniques, such as fluorescence spectroscopy and reflected light spectroscopy.
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Inventors:
FULGHUM STEPHEN F JR (US)
Application Number:
PCT/US2003/001612
Publication Date:
October 16, 2003
Filing Date:
January 17, 2003
Export Citation:
Assignee:
NEWTON LAB INC (US)
FULGHUM STEPHEN F JR (US)
FULGHUM STEPHEN F JR (US)
International Classes:
A61B1/00; A61B1/273; A61B5/00; A61B10/00; G01B11/02; G01N15/02; G01N21/21; G01N21/25; G01N21/27; G01N21/47; G01N21/49; G01N21/64; (IPC1-7): G01N21/47; G01N15/02; G01N21/21; G01N21/64
Domestic Patent References:
| WO1996042006A2 | 1996-12-27 | |||
| WO2000043750A2 | 2000-07-27 | |||
| WO2001034031A1 | 2001-05-17 |
Foreign References:
| US5636637A | 1997-06-10 | |||
| US4541719A | 1985-09-17 | |||
| EP0590268A1 | 1994-04-06 |
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