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Patent Searching and Data


Title:
SPECTROSCOPIC MEASUREMENT DEVICE AND SPECTROMETRY SYSTEM
Document Type and Number:
WIPO Patent Application WO/2018/088553
Kind Code:
A1
Abstract:
This spectroscopic measurement device irradiates a measurement target with light and measures measurement light outputted from the measurement target in response to said irradiation. The spectroscopic measurement device is provided with: a light-shielding first housing which houses a light source that emits light and which has a first opening through which light emitted from the light source passes; a light-shielding second housing which has a second opening through which measurement light passes and which houses a spectrometer which receives the measurement light that passes through the second opening; and a linking unit which links the first housing and the second housing such that the relative positions of the first housing and the second housing can be changed.

Inventors:
KONO MAKOTO (JP)
Application Number:
PCT/JP2017/040743
Publication Date:
May 17, 2018
Filing Date:
November 13, 2017
Export Citation:
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Assignee:
HAMAMATSU PHOTONICS KK (JP)
International Classes:
G01J3/42; G01J3/08; G01N21/01
Foreign References:
JP2003510560A2003-03-18
JPH07198597A1995-08-01
JP2014102217A2014-06-05
JPS54110886A1979-08-30
JPH0325348A1991-02-04
Other References:
See also references of EP 3540396A4
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
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