SPECTROSCOPIC MEASUREMENT METHOD AND SPECTROSCOPIC MEASUREMENT DEVICE

WIPO Patent Application WO/2016/059946

A1

In a spectroscopic measurement method, measurement light from a light source is irradiated onto an object of measurement, transmitted or diffusely reflected light emitted from the object of measurement as a result of the irradiation of the measurement light is received by a plurality of two-dimensionally arranged pixels, spectral data is acquired for a plurality of unit regions including at least one unit region on the object of measurement and a unit region adjacent to the one unit region, and spectral data for the object of measurement is calculated through the averaging of the spectral data for each of the plurality of unit regions. Further, a spectral measurement device images the same unit region of the object of measurement a plurality of times (two or more times) and calculates spectral data for the object of measurement by integrating and averaging the spectral data obtained from the unit regions of the object of measurement imaged a plurality of times.

OKUNO TOSHIAKI (JP)
MORISHIMA TETSU (JP)
FUJIMOTO MIYOKO (JP)

PCT/JP2015/076819

April 21, 2016

September 21, 2015

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SUMITOMO ELECTRIC INDUSTRIES (JP)

G01J3/50; G01N21/359

WO2012090416A1

2012-07-05

US20090171591A1	2009-07-02
JP2006226775A	2006-08-31
JP2008224473A	2008-09-25
JP2007225349A	2007-09-06
JP2010220569A	2010-10-07

GAO B C ET AL.: "A Fast Smoothing Algorithm for Post-Processing of Surface Reflectance Spectra Retrieved from Airborne Imaging Spectrometer Data", SENSORS, vol. 13, 14 October 2013 (2013-10-14), pages 13879 - 13891

NAKATA, Motomi et al. (JP)
Nakada Motoki (JP)

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