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Title:
SPUTTERING TARGET FOR TRANSPARENT CONDUCTIVE FILM
Document Type and Number:
WIPO Patent Application WO/2018/211792
Kind Code:
A1
Abstract:
This sputtering target for transparent conductive film comprises an oxide sintered compact having, as constituent elements, In, Sn, Si and O, the content ratio of In being greater than 25.0% by mass but not more than 82.0% by mass in terms of In2O3, the content ratio of Sn being 15.0% by mass to 65.0% by mass in terms of SnO2, and the content ratio of Si being at least 3.0% by mass but less than 10.0% by mass in terms of SiO2. This sputtering target for conductive film has low resistivity, it is possible to perform DC sputtering, and by sputtering it is possible to form a transparent conductive film having high film resistivity and high chemical resistance.

Inventors:
YANO TOMOYASU (JP)
KOHIRA TOSHIHIRO (JP)
TATEYAMA SHINICHI (JP)
NAKAMURA SHINICHIRO (JP)
Application Number:
PCT/JP2018/008974
Publication Date:
November 22, 2018
Filing Date:
March 08, 2018
Export Citation:
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Assignee:
MITSUI MINING & SMELTING CO (JP)
International Classes:
C23C14/34; C04B35/01; C04B35/457; C23C14/08; H01B5/14; H01B13/00
Foreign References:
JP4424889B22010-03-03
JP2007138266A2007-06-07
JP2005135649A2005-05-26
JP2010198934A2010-09-09
JP2004123479A2004-04-22
JPS6410507A1989-01-13
JPH10237632A1998-09-08
Attorney, Agent or Firm:
SSINPAT PATENT FIRM (JP)
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