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Title:
STATE ASSESSING DEVICE, STATE ASSESSING METHOD, AND STORAGE MEDIUM FOR STORING PROGRAM
Document Type and Number:
WIPO Patent Application WO/2017/221965
Kind Code:
A1
Abstract:
Provided are a state assessing device, a state assessing method and a program with which it is possible to assess an abnormality in a structure remotely and in a non-contact manner, without being affected by the condition of an image capturing device, and while isolating in-plane displacement from out-of-plane displacement. This state assessing device 100 is provided with: a parameter estimating unit 110 which uses time-series images obtained by capturing images of a structure by means of an image capturing device, and using a measured value of the distance from the image capturing device to the structure, to estimate a motion parameter representing relative motion of a surface of the structure relative to the image capturing device; and an abnormality assessing unit 120 which assesses any abnormalities in the structure using the result of the motion parameter estimation.

Inventors:
NAKANO GAKU (JP)
CHAUDHURY SUBHAJIT (JP)
Application Number:
PCT/JP2017/022811
Publication Date:
December 28, 2017
Filing Date:
June 21, 2017
Export Citation:
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Assignee:
NEC CORP (JP)
International Classes:
G01N21/88; G01B21/00; G01M99/00; G01N21/954
Domestic Patent References:
WO2016047093A12016-03-31
Foreign References:
JP2011257389A2011-12-22
JP2011153947A2011-08-11
US20160171309A12016-06-16
Other References:
HIROSHI IMAI ET AL.: "In-plane/ out-of-plane displacement separation in structural internal deterioration detection with monocular motion vector field analysis", 2015 NEN PROCEEDINGS OF THE IEICE ENGINEERING SCIENCES SOCIETY/NOLTA SOCIETY CONFERENCE, 25 August 2015 (2015-08-25)
Attorney, Agent or Firm:
SHIMOSAKA Naoki (JP)
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