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Patent Searching and Data


Title:
STATE-MONITORING DEVICE AND STATE-MONITORING METHOD
Document Type and Number:
WIPO Patent Application WO/2019/044575
Kind Code:
A1
Abstract:
A data computation unit (150) performs a high-speed Fourier transform on measurement waveform data at least once, generates a converted waveform, calculates a first feature amount from a partial waveform of the converted waveform in at least three feature amount calculation ranges centered about peaks at at least three locations in the converted waveform, calculates a second feature amount from the entirety of the converted waveform, and uses the first feature amount and the second feature amount to determine whether an abnormality in a rolling bearing was produced due to damage of the bearing or due to a change in the state of a lubricant that lubricates the bearing. This makes it possible to provide a state-monitoring device and a state-monitoring method with which it is possible to determine the origin of an abnormality in a rotary machine.

Inventors:
TSUTSUI, Hideyuki (105 Hidamarinooka 5-chome, Kuwana-sh, Mie 67, 〒5110867, JP)
Application Number:
JP2018/030737
Publication Date:
March 07, 2019
Filing Date:
August 21, 2018
Export Citation:
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Assignee:
NTN CORPORATION (3-17, Kyomachibori 1-chome Nishi-ku, Osaka-sh, Osaka 03, 〒5500003, JP)
International Classes:
G01M13/04; F16C41/00
Domestic Patent References:
WO2011108391A12011-09-09
Foreign References:
JP2017119285A2017-07-06
JP2012008030A2012-01-12
JP2012242336A2012-12-10
JP2016109647A2016-06-20
US7421349B12008-09-02
US20170059449A12017-03-02
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (Nakanoshima Festival Tower West, 2-4 Nakanoshima 3-chome, Kita-ku, Osaka-sh, Osaka 05, 〒5300005, JP)
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