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Patent Searching and Data


Title:
STATUS DETERMINATION DEVICE AND STATUS DETERMINATION METHOD
Document Type and Number:
WIPO Patent Application WO/2016/047093
Kind Code:
A1
Abstract:
The present invention addresses the problem of making it possible to distinguish and detect cracking, peeling, internal cavities, and other defects through the remote observation of a structure. A status determination device according to the present invention is provided with a displacement calculation unit for calculating a two-dimensional spatial distribution of the displacement of a structure surface from time series images of the structure surface before and after load application and an abnormality determination unit for identifying flaws in the structure on the basis of a comparison of the two-dimensional spatial distribution and an already provided spatial distribution of displacement.

Inventors:
IMAI HIROSHI (JP)
Application Number:
PCT/JP2015/004682
Publication Date:
March 31, 2016
Filing Date:
September 15, 2015
Export Citation:
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Assignee:
NEC CORP (JP)
International Classes:
G01N19/08; G01B11/16; G01M5/00
Foreign References:
JP2012032195A2012-02-16
JP2011257368A2011-12-22
Other References:
YOSHIHIRO OKADA ET AL.: "Verification of Casting defects for Aluminum Casting Alloy using Digital Image Correlation Method", THE JAPAN SOCIETY OF MECHANICAL ENGINEERS 2005 NENDO NENJI TAIKAI KOEN RONBUNSHU, vol. 1, 19 September 2005 (2005-09-19), pages 345 - 346
Attorney, Agent or Firm:
SHIMOSAKA, NAOKI (JP)
Naoki Shimosaka (JP)
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