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Patent Searching and Data


Title:
STORAGE DEVICE TESTING SYSTEMS
Document Type and Number:
WIPO Patent Application WO/2013/043786
Kind Code:
A3
Abstract:
A storage device test system includes a test slot configured to receive at least two storage devices for testing, the at least two storage devices being in a same plane.

Inventors:
MERROW BRIAN S (US)
TOSCANO JOHN P (US)
DUTREMBLE TOM (US)
TRUEBENBACH ERIC L (US)
Application Number:
US2012/056203
Publication Date:
June 27, 2013
Filing Date:
September 20, 2012
Export Citation:
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Assignee:
TERADYNE INC (US)
International Classes:
G01R31/00
Foreign References:
US7634375B12009-12-15
US20110157825A12011-06-30
US7676714B22010-03-09
JP2007066126A2007-03-15
KR20100103212A2010-09-27
Attorney, Agent or Firm:
MCDONOUGH, Christina V. et al. (P.O. Box 1022Minneapolis, Massachusetts, US)
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