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Title:
STRUCTURE ABNORMALITY DETECTION DEVICE, STRUCTURE ABNORMALITY DETECTION METHOD, RECORDING MEDIUM, AND STRUCTURE ABNORMALITY DETECTION SYSTEM
Document Type and Number:
WIPO Patent Application WO/2017/064854
Kind Code:
A1
Abstract:
A structure abnormality detection device for detecting an abnormality of a structure, said structure abnormality detection device including a means for storing a model for predicting, from a first inspection value acquired at a first inspection position, a second inspection value acquired at a second inspection position that is a position having roughly the same vibration intensity as the first inspection position during vibration in a prescribed vibration mode at the natural frequency of the structure and a means for detecting an abnormality of the structure by evaluating how well a first inspection value and second inspection value acquired at a specific time fit the model.

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Inventors:
MASE RYOTA (JP)
KASAHARA SHINJI (JP)
OCHIAI KATSUHIRO (JP)
Application Number:
PCT/JP2016/004524
Publication Date:
April 20, 2017
Filing Date:
October 07, 2016
Export Citation:
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Assignee:
NEC CORP (JP)
International Classes:
G01M99/00
Domestic Patent References:
WO2015033603A12015-03-12
Foreign References:
JPH07128182A1995-05-19
JP2013040774A2013-02-28
Attorney, Agent or Firm:
OKABE, Yuzuru et al. (JP)
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