Title:
STRUCTURE ASSESSMENT SYSTEM, STRUCTURE ASSESSMENT DEVICE AND STRUCTURE ASSESSMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2017/199542
Kind Code:
A1
Abstract:
A structure assessment system according to one embodiment comprises a plurality of AE sensors, a signal processing unit, a position locating unit, a speed calculating unit, and an assessment unit. The AE sensors detect elastic waves generated by a structure. The signal processing unit extracts an AE signal that includes information pertaining to the elastic waves, by performing signal processing on the elastic waves detected by the AE sensors. The position locating unit derives a source distribution that represents the distribution of sources of the elastic waves generated by the structure, on the basis of the AE signal. The speed calculating unit derives, on the basis of the AE signal, the velocity of propagation of the elastic wave generated by the structure. The assessment unit assesses the soundness of the structure on the basis of the source distribution and the velocity of propagation.
Inventors:
WATABE KAZUO (JP)
TAKAMINE HIDEFUMI (JP)
SHIOTANI TOMOKI (JP)
TAKAMINE HIDEFUMI (JP)
SHIOTANI TOMOKI (JP)
Application Number:
PCT/JP2017/008818
Publication Date:
November 23, 2017
Filing Date:
March 06, 2017
Export Citation:
Assignee:
TOSHIBA KK (JP)
UNIV KYOTO (JP)
UNIV KYOTO (JP)
International Classes:
G01N29/14; G01N29/06; G01N29/07
Foreign References:
| JPH09218182A | 1997-08-19 | |||
| JP2014095555A | 2014-05-22 | |||
| US4531411A | 1985-07-30 | |||
| JP2004125721A | 2004-04-22 |
Other References:
See also references of EP 3264076A4
Attorney, Agent or Firm:
SHIGA INTERNATIONAL PATENT OFFICE (JP)
Download PDF: