Title:
STRUCTURE ASSESSMENT SYSTEM, STRUCTURE ASSESSMENT DEVICE AND STRUCTURE ASSESSMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2017/199544
Kind Code:
A1
Abstract:
A structure assessment system according to one embodiment comprises: a plurality of sensors, a position locating unit, a velocity calculation unit and an assessment unit. The sensors detect elastic waves generated by a structure. The position locating unit derives a source distribution for the elastic waves, on the basis of the elastic waves. The velocity calculation unit derives the velocity of propagation of the elastic waves on the basis of the elastic waves. The assessment unit assesses the soundness of the structure, on the basis of the source distribution and the velocity of propagation of the elastic waves.
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Inventors:
WATABE KAZUO (JP)
TAKAMINE HIDEFUMI (JP)
SHIOTANI TOMOKI (JP)
TAKAMINE HIDEFUMI (JP)
SHIOTANI TOMOKI (JP)
Application Number:
PCT/JP2017/008850
Publication Date:
November 23, 2017
Filing Date:
March 06, 2017
Export Citation:
Assignee:
TOSHIBA KK (JP)
UNIV KYOTO (JP)
UNIV KYOTO (JP)
International Classes:
G01N29/14; G01N29/06; G01N29/07
Foreign References:
| JPH09218182A | 1997-08-19 | |||
| JP2014095555A | 2014-05-22 | |||
| US4531411A | 1985-07-30 | |||
| JP2004125721A | 2004-04-22 |
Other References:
See also references of EP 3428635A4
Attorney, Agent or Firm:
SHIGA INTERNATIONAL PATENT OFFICE (JP)
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