Title:
STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD
Document Type and Number:
WIPO Patent Application WO/2019/167137
Kind Code:
A1
Abstract:
A structure evaluation system according to an embodiment comprises a plurality of sensors, a position location unit, and an evaluation unit. The plurality of sensors detect elastic waves. Using elastic waves, from among the plurality of elastic waves detected by the plurality of sensors, having an amplitude exceeding a threshold determined according to the position of the source of the plurality of elastic waves and the positions at which the plurality of sensors are disposed, the position location unit locates the position of the source of the elastic waves. The evaluation unit evaluates the deterioration state of the structure on the basis of the result of the location by the position location unit of the position of the source of the elastic waves.
Inventors:
SHIOTANI TOMOKI (JP)
HASHIMOTO KATSUFUMI (JP)
TAKAMINE HIDEFUMI (JP)
WATABE KAZUO (JP)
HASHIMOTO KATSUFUMI (JP)
TAKAMINE HIDEFUMI (JP)
WATABE KAZUO (JP)
Application Number:
PCT/JP2018/007314
Publication Date:
September 06, 2019
Filing Date:
February 27, 2018
Export Citation:
Assignee:
TOSHIBA KK (JP)
UNIV KYOTO (JP)
UNIV KYOTO (JP)
International Classes:
G01N29/14
Domestic Patent References:
| WO2017199544A1 | 2017-11-23 |
Foreign References:
| US20140123758A1 | 2014-05-08 | |||
| JP2017090311A | 2017-05-25 | |||
| JP2004125721A | 2004-04-22 |
Other References:
See also references of EP 3761022A4
Attorney, Agent or Firm:
SHIGA INTERNATIONAL PATENT OFFICE (JP)
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