Title:
STRUCTURE IMAGING APPARATUS, STRUCTURE INSPECTION APPARATUS, AND STRUCTURE INSPECTION SYSTEM
Document Type and Number:
WIPO Patent Application WO/2017/057356
Kind Code:
A1
Abstract:
This structure imaging apparatus is provided with an imaging unit (11) for imaging an area to be imaged (40a) of a placement surface (40), a bending optical system (16) that bends the direction of imaging by the imaging unit (11), and a lighting unit (12a) that lights the area to be imaged (40a). This structure inspection apparatus is further provided with a position change detection unit (13) that detects a position change due to a movement on the placement surface (40), and an imaging timing control unit (14a) that controls timing of imaging by the imaging unit (11) on the basis of the position change detected by the position change detection unit (13).
Inventors:
MIZOBE YOSHIYUKI (JP)
YAMAMOTO MINORU (JP)
FUTAMURA TAKAFUSA (JP)
YAMAMOTO MINORU (JP)
FUTAMURA TAKAFUSA (JP)
Application Number:
PCT/JP2016/078444
Publication Date:
April 06, 2017
Filing Date:
September 27, 2016
Export Citation:
Assignee:
KURASHIKI BOSEKI KK (JP)
International Classes:
G01N21/88; E01C23/01; E01D22/00; G01N21/84
Foreign References:
| JP2015072220A | 2015-04-16 | |||
| JPS60177261A | 1985-09-11 | |||
| JPH04240555A | 1992-08-27 | |||
| JPS61275642A | 1986-12-05 | |||
| JP2002040335A | 2002-02-06 | |||
| JP2009109352A | 2009-05-21 | |||
| US6615648B1 | 2003-09-09 |
Attorney, Agent or Firm:
ARC PATENT ATTORNEYS' OFFICE (JP)
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