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Patent Searching and Data


Title:
STRUCTURE INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2002/018927
Kind Code:
A1
Abstract:
Vibration generated on a surface to be measured is directly converted into voltage, without the intermediary of a medium such as air, by bringing a vibration sensor into a direct contact with the surface to be measured to quantify the vibration generated on the surface, and the internal conditions of a concrete structure are objectively evaluated independently of surrounding noises and the shape of a hammer. A structure inspection device which comprises an exciting device for generating an elastic wave on an object to be measured of a concrete structure, a vibration detector for detecting, by being contacted with the surface of the object to be measured, the components within a specified frequency range of the elastic wave generated on the object surface by the exciting device, and a display for displaying a maximum amplitude of an output signal from the vibration detector.

Inventors:
SHIMADA TAKASHI (JP)
MATSUHASHI KANJI (JP)
Application Number:
PCT/JP2000/005797
Publication Date:
March 07, 2002
Filing Date:
August 28, 2000
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP (JP)
MATSUHASHI TECHNO RES CO LTD (JP)
SHIMADA TAKASHI (JP)
MATSUHASHI KANJI (JP)
International Classes:
G01M7/00; G01N3/32; G01N3/40; G01N29/04; G01N29/42; G01N29/46; G01N33/38; G01N3/00; G01N3/02; G01N3/06; (IPC1-7): G01N29/12; G01N3/30
Foreign References:
JPH01219555A1989-09-01
JPH0392758A1991-04-17
JP2000131290A2000-05-12
Other References:
See also references of EP 1236996A4
Attorney, Agent or Firm:
Soga, Michiteru (Kokusai Building 1-1 Marunouchi 3-chome Chiyoda-ku, Tokyo, JP)
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