STRUCTURE AND METHOD FOR TESTING LOCK-IN AMPLIFIER

WIPO Patent Application WO/2018/059232

A1

A structure for testing a lock-in amplifier (300). A test signal generating device (100) of the structure comprises: a signal source module (120) used for generating a pure signal; a noise module (140) used for generating noise; an addition circuit (160) having two input ends connected respectively to the signal source module (120) and to the noise module (140) and used for superimposing the pure signal and the noise to produce a test signal for inputting into the lock-in amplifier (300); a first switch (K1) is provided on a branch connecting the signal source module (120) and the addition circuit (160), and a second switch (K2) is provided on a branch connecting the noise module (140) and the addition circuit (160). The structure for testing the lock-in amplifier (300), by controlling the switches, allows the test signal to be either pure noise or an aliased signal, thus testing the noise resistance capability of the lock-in amplifier (300) in different noise frequency band ranges and amplitude ranges, producing a noise distribution state of reference signals of nearby frequencies, and at the same time testing other parameters of the lock-in amplifier (300).

DENG SHIFA (CN)
PAN YI (CN)
LI CHEN (CN)
DING QING (CN)

PCT/CN2017/101493

April 05, 2018

September 13, 2017

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SHENZHEN INST TERAHERTZ TECH & INNOVATION (CN)
SHENZHEN TERAHERTZ SYSTEM EQUIPMENT CO LTD (CN)

G01R31/00

CN106483402A	2017-03-08
CN104820145A	2015-08-05
CN204633728U	2015-09-09
CN102045036A	2011-05-04
CN105092985A	2015-11-25
CN105245194A	2016-01-13
US9182265B1	2015-11-10
US20140292363A1	2014-10-02

ADVANCE CHINA IP LAW OFFICE (CN)

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