STRUCTURE, OPTICAL MEASUREMENT DEVICE, METHOD FOR PRODUCING STRUCTURE, AND COMPOSITION

WIPO Patent Application WO/2020/121989

A1

A structure comprising: a light-emitting unit which is formed on one surface of a base plate and emits measurement light; a first light receiving unit which is formed on the one surface and receives reflected light of the measurement light from a target object; a second light receiving unit which is situated on the one surface so as to be closer than the first light receiving unit is to the light-emitting unit and receives a portion of the measurement light as reference light; a light transmitting member which is disposed over the base plate so that the light-emitting unit, the first light receiving unit, and the second light receiving unit are therebetween and allows the measurement light to pass therethrough; and a light-blocking part for reducing noise light from the measurement light travelling through the base plate and the light transmitting member and arriving at the first light receiving unit. In addition, the present invention relates to an optical measurement device having the above structure, a method for producing the structure, and a composition used when producing the structure.

WO/2017/119324	SENSOR HOUSING DEVICE
WO/2017/168500	OPTICAL DEVICE
WO/2018/153008	LASER POSITIONING APPARATUS AND LASER POSITIONING METHOD

SAIE TOSHIYUKI (JP)
SHIMADA KAZUTO (JP)

PCT/JP2019/047993

June 18, 2020

December 09, 2019

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FUJIFILM CORP (JP)

G01S7/481

WO2017094279A1	2017-06-08
WO2018199132A1	2018-11-01

CN206223977U	2017-06-06
JP2011064851A	2011-03-31

SIKs & Co. (JP)

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