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Title:
STRUCTURE REPAIR METHOD SELECTION SYSTEM, REPAIR METHOD SELECTION METHOD, AND REPAIR METHOD SELECTION SERVER
Document Type and Number:
WIPO Patent Application WO/2020/110587
Kind Code:
A1
Abstract:
Provided are a structure repair method selection system, a repair method selection method, and a repair method selection server that make it possible to select a suitable repair method. The structure repair method selection system (100) is provided with: a repair evaluation unit (105) that determines evaluation points for a structure after repair thereof; a database (110) that includes captured images of structures, data regarding evaluation points, and the like; an image acquisition unit (115) that acquires a captured image of a target structure to be repaired; a damage detection unit (125) that detects damage from the captured image; a similar damage extraction unit (130) that uses the database (110) to extract similar damage similar to the aforementioned damage; and a repair method presentation unit (135) that uses the evaluation points as a basis to present a repair method for the similar damage. Also provided are a repair method selection method using the structure repair method selection system (100), and a repair method selection server.

Inventors:
HORITA SHUHEI (JP)
Application Number:
PCT/JP2019/042731
Publication Date:
June 04, 2020
Filing Date:
October 31, 2019
Export Citation:
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Assignee:
FUJIFILM CORP (JP)
International Classes:
E01D22/00; G06Q10/00; G06Q50/08
Domestic Patent References:
WO2017051550A12017-03-30
WO2017051550A12017-03-30
WO2018051550A12018-03-22
Foreign References:
JP2007140608A2007-06-07
JP2016099235A2016-05-30
JP2017228208A2017-12-28
JP2002024323A2002-01-25
JP2005339249A2005-12-08
JP2006177080A2006-07-06
JP4006007B22007-11-14
Other References:
See also references of EP 3889356A4
Attorney, Agent or Firm:
NAKASHIMA Junko et al. (JP)
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