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Title:
STRUCTURED ILLUMINATION MICROSCOPIC DEVICE AND STRUCTURED ILLUMINATION OBSERVATION METHOD
Document Type and Number:
WIPO Patent Application WO/2015/162921
Kind Code:
A1
Abstract:
The present invention is provided with: a first spatial modulation unit that has a sine wave illumination distribution of a spatial frequency (K) and spatially modulates a fluorescent sample using an excitation light having an optical frequency (ω1) for shifting a fluorescent substance to an excitation level; a second spatial modulation unit that has a sine wave illumination distribution of a spatial frequency (K) and spatially modulates the fluorescent sample using a guide light having an optical frequency (ω2) for shifting the excited fluorescent substance to a base level; and an imaging unit that acquires, as a modulated image, an image of the fluorescent sample obtained by means of spontaneously emitted light generated by the fluorescent sample in response to the excitation light and the guide light.

Inventors:
DAKE FUMIHIRO (JP)
YAZAWA HIROKI (JP)
Application Number:
PCT/JP2015/002192
Publication Date:
October 29, 2015
Filing Date:
April 22, 2015
Export Citation:
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Assignee:
NIKON CORP (JP)
International Classes:
G02B21/06; G01N21/64; G02B21/36
Domestic Patent References:
WO2014057998A12014-04-17
WO2014013720A12014-01-23
Foreign References:
JP2010506203A2010-02-25
Other References:
HAN ZHANG ET AL.: "Nonlinear structured illumination microscopy by surface plasmon enhanced stimulated emission depletion", OPTICS EXPRESS, vol. 19, no. 24, 18 November 2011 (2011-11-18), pages 24783 - 24794, XP055232611
HAN ZHANG ET AL.: "Nonlinear Structured Illumination Microscopy with Surface Plasmon Resonance Enhanced Stimulated Emission Depletion", PROC. OF SPIE, vol. 8590, 22 February 2013 (2013-02-22), pages 859011 - 1 - 859011-6, XP055232616
Attorney, Agent or Firm:
FURUYA, Fumio et al. (JP)
Furuya History Wang (JP)
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