SUBJECTIVE EYE EXAMINATION DEVICE

WIPO Patent Application WO/2018/230420

A1

This subjective eye examination device for subjectively measuring an optical characteristic of a subject eye is provided with: a projection optical system which includes an optotype presenting unit and an optical member, projects the optotype light flux toward the subject eye, and causes optotype light flux emitted from the optotype presenting unit to be incident while shifted with respect to an optical axis of the optical member; a housing accommodating the projection optical system; a presenting window for emitting the optotype light flux from the inside of the housing toward the outside thereof; an ocular refractive power measuring unit which is provided outside the housing; and a holding means for integrally coupling the housing to the ocular refractive power measuring unit and holding the ocular refractive power measuring unit; wherein, when using the ocular refractive power measuring unit, a first distance from the presenting window to the ocular refractive power measuring unit on an optical path along which the optotype light flux from the optotype presenting unit is projected into the subject eye is at most equal to 180 mm.

JP6841091	Subjective optometry device
WO/2022/122710	METHOD AND DEVICE FOR DETERMINING AT LEAST ONE ASTIGMATIC EFFECT OF AT LEAST ONE EYE

KOBAYASHI TOSHIHIRO (JP)
HIRAYAMA YUKITO (JP)
SUZUKI RYOJI (JP)
SHIBATA KAZUNORI (JP)
BABA DAISUKE (JP)

PCT/JP2018/021774

December 20, 2018

June 06, 2018

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NIDEK KK (JP)

A61B3/032; A61B3/028

JP2014128314A	2014-07-10
JP2013048753A	2013-03-14
JPH04347125A	1992-12-02
JPH05176893A	1993-07-20
JP2007068574A	2007-03-22
JP2011072431A	2011-04-14
JP2004329345A	2004-11-25

See also references of EP 3639726A4

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