Title:
SUBSTRATE FOR ANALYSIS FOR USE IN RAMAN SPECTROSCOPIC ANALYSIS AND SUBSTRATE ASSEMBLY FOR ANALYSIS
Document Type and Number:
WIPO Patent Application WO/2007/049487
Kind Code:
A1
Abstract:
This invention provides a substrate or substrate assembly for Raman spectroscopic
analysis that can analyze even a low-concentration substance with high sensitivity.
The substrate (1) for use in Raman spectroscopic analysis comprises a predetermined
transparent substrate (3) and metal particles (5) unevenly deposited on a surface
of the transparent substrate (3).
Inventors:
ONA TOSHIHIRO (JP)
MURAKAMI SHUICHI (JP)
MURAKAMI SHUICHI (JP)
Application Number:
PCT/JP2006/320703
Publication Date:
May 03, 2007
Filing Date:
October 18, 2006
Export Citation:
Assignee:
UNIV KYUSHU NAT UNIV CORP (JP)
ONA TOSHIHIRO (JP)
MURAKAMI SHUICHI (JP)
ONA TOSHIHIRO (JP)
MURAKAMI SHUICHI (JP)
International Classes:
G01N21/65
Domestic Patent References:
| WO2002073164A1 | 2002-09-19 |
Foreign References:
| JP2005077362A | 2005-03-24 | |||
| JP2003510065A | 2003-03-18 | |||
| JP2003511666A | 2003-03-25 |
Other References:
See also references of EP 1950556A4
Attorney, Agent or Firm:
SHAMOTO, Ichio et al. (Section 206 New Ohtemachi Bldg., 2-1, Ohtemachi 2-chome, Chiyoda-k, Tokyo 04, JP)
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