Title:
SUBSTRATE DEFECT BASED DEMODULATION
Document Type and Number:
WIPO Patent Application WO/2017/189113
Kind Code:
A3
Abstract:
Devices and methods for demodulating a frequency modulated electromagnetic wave are provided. In various embodiments, a device includes a substrate comprising at least a first region having a plurality of atomic defects therewithin. The device includes a light source configured to emit electromagnetic radiation of a first wavelength and to illuminate the first region of the substrate. The first region of the substrate emits electromagnetic radiation of a second wavelength when exposed to electromagnetic radiation of the first wavelength. The device includes a photodetector configured to detect electromagnetic radiation of the second wavelength. The photodetector is configured to detect electromagnetic radiation emitted by the first region of the substrate.
Inventors:
SHAO LINBO (US)
ZHANG MIAN (US)
LONCAR MARKO (US)
ZHANG MIAN (US)
LONCAR MARKO (US)
Application Number:
PCT/US2017/022527
Publication Date:
January 11, 2018
Filing Date:
March 15, 2017
Export Citation:
Assignee:
HARVARD COLLEGE (US)
International Classes:
G01N21/17; G01N21/63; G01N21/64; G01R33/032; H03D3/00
Foreign References:
| US20150001422A1 | 2015-01-01 | |||
| US7113276B1 | 2006-09-26 | |||
| US4880613A | 1989-11-14 | |||
| US20130214780A1 | 2013-08-22 |
Other References:
SHAO ET AL.: "Wide-Field Optical Microscopy of Microwave Fields Using Nitrogen-Vacancy Centers in Diamonds", ADV. OPTICAL MATER., vol. 4, 11 May 2016 (2016-05-11), pages 10 75 - 1080, XP055450437, Retrieved from the Internet [retrieved on 20171024]
Attorney, Agent or Firm:
AKHIEZER, Alexander et al. (US)
Download PDF: