SUBSTRATE INSPECTION DEVICE AND SUBSTRATE INSPECTION METHOD

WIPO Patent Application WO/2015/045057

A1

The present invention is a substrate inspection device which is disposed in the middle of a component mounting line which produces a substrate on which a plurality of components are mounted, inspects the components that have been mounted, and inspects mounting positions upon a substrate for which components are to be mounted. The substrate inspection device is provided with: a means for setting areas, upon a substrate, that are treated as necessary for inspection of mounted components as component inspection areas; a means for listing components to be mounted, together with the mounting positions for the same, in a subsequent step component list; a means for setting areas, upon the substrate, necessary for inspecting for the presence of foreign matter on the mounting positions as foreign matter inspection areas on the basis of the subsequent step component list; and a means for implementing inspection on the basis of acquired state information related to the component inspection areas and the foreign matter inspection areas. As a result, it is possible to automatically set areas upon the substrate necessary for inspection of the mounting positions as foreign matter inspection areas so as to mitigate burden in preparation work for a worker, as well as to eliminate the need for the worker to have special skills.

KURASHINA TAKASHI (JP)

PCT/JP2013/076041

April 02, 2015

September 26, 2013

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FUJI MACHINE MFG (JP)

H05K13/08

JP2003110299A	2003-04-11
JP2009004754A	2009-01-08
JP2011014946A	2011-01-20
JP2005150378A	2005-06-09
JP2010258115A	2010-11-11

KOBAYASHI OSAMU (JP)
Kobayashi 脩 (JP)

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