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Title:
SUPER RESOLUTION IMAGING METHOD USING LOCAL BINARY PATTERN CLASSIFICATION AND LINEAR MAPPING
Document Type and Number:
WIPO Patent Application WO/2019/194482
Kind Code:
A1
Abstract:
A super resolution imaging method according to the present invention can comprise the steps of: receiving an input image having a low resolution (LR); dividing the input image into LR unit patches; classifying a texture type of each pixel included in the input image by using a local binary pattern with respect to the LR unit patches; generating, on the basis of a mapping kernel corresponding to the texture type, high resolution (HR) unit patches respectively corresponding to the pixels; and generating an HR output image by combining the HR unit patches according to a predetermined configuration.

Inventors:
BAE, Sung-Ho (#106-701, 40 113beon-gil Singalma-ro,Seo-Gu, Daejeon, 35282, KR)
LEE, Sungyoung (#102-102, 25 144beon-gil Gumi-ro,Bundang-Gu Seongnam-Si, Gyeonggi-do, 13622, KR)
Application Number:
KR2019/003764
Publication Date:
October 10, 2019
Filing Date:
April 01, 2019
Export Citation:
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Assignee:
UNIVERSITY-INDUSTRY COOPERATION GROUP OF KYUNG HEE UNIVERSITY (1732, Deogyeong-daero,Giheung-Gu Yongin-Si, Gyeonggi-do, 17104, KR)
International Classes:
G06T3/40; G06K9/62; G06T7/40
Domestic Patent References:
WO2015083396A12015-06-11
Foreign References:
JP2017500651A2017-01-05
JP2008299618A2008-12-11
KR20140040322A2014-04-03
KR20150107360A2015-09-23
Attorney, Agent or Firm:
KIM, Hong Suk (Dongjin International Patent & Law Firm, No.405 111 Digital-ro 26-gil,,Guro-Gu, Seoul, 08390, KR)
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