SURFACE ABNORMALITY DETECTION DEVICE, SYSTEM, METHOD, AND NON-TRANSITORY COMPUTER-READABLE MEDIUM

WIPO Patent Application WO/2021/038685

A1

The purpose of this disclosure is to provide a surface abnormality detection device, system, method, and non-transitory computer-readable medium that make it possible to identify an abnormal location on the surface of a complicated structure. A surface abnormality detection device (11) according to this disclosure comprises: a division means (111) for dividing a structure into a plurality of clusters on the basis of position information for a plurality of points on the surface of the structure; a joining means (112) for creating a cluster group by joining two or more of the clusters; a determination means (113) for determining a normal reflection brightness value for the cluster group on the basis of a distribution of reflection brightness values at a plurality of points on the surface of the cluster group; and an identification means (114) for identifying an abnormal location on the surface of the cluster group on the basis of the differences between the normal reflection brightness value and the reflection brightness values of each of the plurality of points on the surface of the cluster group.

ONO YOSHIMASA (JP)
TSUJI AKIRA (JP)
ABE JUNICHI (JP)

PCT/JP2019/033294

March 04, 2021

August 26, 2019

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NEC CORP (JP)

G01N21/88; G01S17/89; G06T7/10

JP2017032360A	2017-02-09
JP2019020580A	2019-02-07
JP2017083348A	2017-05-18
JP2018137413A	2018-08-30
JP2017173054A	2017-09-28
JP2012078144A	2012-04-19
JP2002181520A	2002-06-26

IEIRI Takeshi (JP)

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