Title:
SURFACE DEFECT DETECTING METHOD AND SURFACE DEFECT DETECTING DEVICE
Document Type and Number:
WIPO Patent Application WO/2024/070101
Kind Code:
A1
Abstract:
This surface defect detecting method for optically detecting a surface defect of a strip-shaped body includes an image acquisition step for detecting reflected light from the strip-shaped body, obtained by illuminating a surface of the strip-shaped body, and imaging the surface of the strip-shaped body while scanning relative thereto, to acquire a plurality of images including the surface of the strip-shaped body, an average image calculation step for calculating an average image of the plurality of acquired images, an image correction step for obtaining a corrected image by performing shading correction of each of the plurality of acquired images using the average image, and a defect detection step for detecting a surface defect of the strip-shaped body on the basis of the corrected image, wherein the average image calculation step includes recognizing an inspection target region, of the image, in which the strip-shaped body is present, in each of the plurality of images, and arranging that only pixels in the inspection target region contribute to the average image.
Inventors:
UMEGAKI YOSHIYUKI (JP)
ONO HIROAKI (JP)
ONO HIROAKI (JP)
Application Number:
PCT/JP2023/024078
Publication Date:
April 04, 2024
Filing Date:
June 28, 2023
Export Citation:
Assignee:
JFE STEEL CORP (JP)
International Classes:
G01N21/892
Domestic Patent References:
| WO2021149588A1 | 2021-07-29 |
Foreign References:
| JP2018155690A | 2018-10-04 | |||
| JP2016156671A | 2016-09-01 | |||
| US20180374220A1 | 2018-12-27 | |||
| JP2008102818A | 2008-05-01 | |||
| JP2004226347A | 2004-08-12 | |||
| JP2017219343A | 2017-12-14 |
Attorney, Agent or Firm:
SUGIMURA Kenji (JP)
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