SURFACE FLAW DETECTION METHOD, SURFACE FLAW DETECTION DEVICE, AND MANUFACTURING METHOD FOR STEEL MATERIAL

Title:

SURFACE FLAW DETECTION METHOD, SURFACE FLAW DETECTION DEVICE, AND MANUFACTURING METHOD FOR STEEL MATERIAL

Document Type and Number:

WIPO Patent Application WO/2016/208626

Kind Code:

A1

Abstract:

A surface flaw detection method according to the present invention is a method for optically detecting a surface flaw in a steel material, said surface flaw detection method being characterized by having an irradiation step, in which at least two differentiable light sources are used to irradiate illumination light on the same detection target site from different directions, and a detection step, in which a surface flaw at the detection target site is detected by acquiring images produced by the reflected light of each illumination light and carrying out differential processing between the acquired images, and further characterized in that the incident angle of the illumination light from each light source against the detection target site is in the range of 60° to 82.5°.

Inventors:

ONO HIROAKI (JP)
TATE MASAMI (JP)
OSHIGE TAKAHIKO (JP)
KODAMA TOSHIFUMI (JP)
KOSHIHARA TAKAHIRO (JP)
OGAWA AKIHIRO (JP)
IIZUKA YUKINORI (JP)

Application Number:

PCT/JP2016/068524

Publication Date:

December 29, 2016

Filing Date:

June 22, 2016

Export Citation:

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Assignee:

JFE STEEL CORP (JP)

International Classes:

G01N21/892

Domestic Patent References:

WO2015098929A1

2015-07-02

Foreign References:

JP2010223621A	2010-10-07
JPH04294204A	1992-10-19
JP2001514386A	2001-09-11
JP2000241362A	2000-09-08
JPS5952735A	1984-03-27
JPH05118997A	1993-05-14
JP2006329919A	2006-12-07
EP2693403A1	2014-02-05

Other References: