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Patent Searching and Data


Title:
SURFACE LAYER DISRUPTION AND IONIZATION UTILIZING AN EXTREME ULTRAVIOLET RADIATION SOURCE
Document Type and Number:
WIPO Patent Application WO/2019/147748
Kind Code:
A3
Abstract:
A surface ionizer for a trace detection system includes an extreme ultraviolet light source and an ion transfer line. Activation of the extreme ultraviolet light disrupts a surface of a sample along with residue and ionizes the resulting vapor. The ionized vapor is collected in the ion transfer line and passed into an analysis device for detection of components in the vapor.

Inventors:
VERKERK, Udo, H. (1702-320-Assiniboine Road, Toronto, Ontario M3J 1L1, 1L1, CA)
ROMANOV, Vladimir (15 Caribou Crossing, Pelham, NH, 03076, US)
JENNINGS, Alison (354 Hewitt Circle, Newmarket, ON L3X 2H1, 2H1, CA)
LAI, Hanh, T. (12 Lakeview Street, Arlington, MA, 02478, US)
HOPKINSON, Alan (104 Lynwood Crescent, Nobleton, Ontario L0G 1N0, 1N0, CA)
Application Number:
US2019/014872
Publication Date:
September 19, 2019
Filing Date:
January 24, 2019
Export Citation:
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Assignee:
RAPISCAN SYSTEMS, INC. (2805 Columbia Street, Torrance, CA, 90503, US)
International Classes:
H01J49/04; H01J27/26; H01J49/10; H01J49/14; H01J49/16; H01J49/26
Domestic Patent References:
WO2016179291A12016-11-10
Foreign References:
CN103797559A2014-05-14
US20150292077A12015-10-15
US6726886B22004-04-27
US20150371807A12015-12-24
Attorney, Agent or Firm:
DALAL, Sona (Novel IP, 191 West Second StreetSanta Ana, CA, 92701, US)
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