SURFACE-PLASMON ENHANCED FLUORESCENCE MEASUREMENT METHOD, SURFACE-PLASMON ENHANCED FLUORESCENCE MEASUREMENT DEVICE, AND ANALYTICAL CHIP

Title:

SURFACE-PLASMON ENHANCED FLUORESCENCE MEASUREMENT METHOD, SURFACE-PLASMON ENHANCED FLUORESCENCE MEASUREMENT DEVICE, AND ANALYTICAL CHIP

Document Type and Number:

WIPO Patent Application WO/2015/182747

Kind Code:

A1

Abstract:

　First, an analytical chip having a prism, a metal film that includes a trapping region having immobilized on the surface thereof a trapping element for trapping a substance to be analyzed, and a mark in which the scatter of emitted plasmon scattered light differs from the scatter of plasmon scattered light emitted from the surrounding region, is placed in a chip holder. Next, the rear surface of the metal film is irradiated with excitation light, plasmon scattered light emitted from the proximity of the mark is detected, and, on the basis of the detected plasmon scattered light, location information for the trap region is obtained. Next, the portion of the rear surface of the metal film that corresponds to the trap region arranged at the detected location is irradiated with excitation light, and fluorescence emitted by a fluorescent substance is detected.

Inventors:

MATSUO MASATAKA
HIRAYAMA HIROSHI
HAMANO YOSHIMASA
NODA TETSUYA
OKUMURA YOSHIHIRO

Application Number:

PCT/JP2015/065560

Publication Date:

December 03, 2015

Filing Date:

May 29, 2015

Export Citation:

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Assignee:

KONICA MINOLTA INC (JP)

International Classes:

G01N21/64

Domestic Patent References:

WO2013099871A1	2013-07-04
WO2014076926A1	2014-05-22

Foreign References:

JP2012117931A	2012-06-21
JP2010286421A	2010-12-24
JP2008267959A	2008-11-06

Other References: