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Title:
SURFACE PLASMON RESONANCE FLUORESCENCE ANALYSIS DEVICE AND SURFACE PLASMON RESONANCE FLUORESCENCE ANALYSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2020/036010
Kind Code:
A1
Abstract:
Provided are a surface plasmon resonance fluorescence analysis device and surface plasmon resonance fluorescence analysis method that make it possible to enhance measurement accuracy while reducing the measurement time for enhancement angle scanning. The surface plasmon resonance fluorescence analysis device comprises an enhancement angle determination unit (control processing unit 164) for irradiating excitation light onto a metal film 30, detecting the intensity of plasmon scattered light emitted from the surface of the metal film 30, and determining an enhancement angle and a fluorescence intensity detection unit (control processing unit 164) for irradiating the excitation light such that the angle of incidence thereof is the enhancement angle and detecting the intensity of the fluorescence emitted from a fluorescent substance. The enhancement angle determination unit comprises a prescanning unit (control processing unit 164) for scanning a prescribed angular range at a first angular interval, detecting the intensity of plasmon scattered light, and estimating the enhancement angle and a main scanning unit (control processing unit 164) for scanning a range in the vicinity of the estimated enhancement angle at a second angular interval narrower than the first angular interval, detecting the intensity of plasmon scattered light, and determining the enhancement angle.

Inventors:
KUNIMOTO AKIRA (JP)
Application Number:
PCT/JP2019/026305
Publication Date:
February 20, 2020
Filing Date:
July 02, 2019
Export Citation:
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Assignee:
KONICA MINOLTA INC (JP)
International Classes:
G01N21/64
Domestic Patent References:
WO2015119154A12015-08-13
WO2018034143A12018-02-22
WO2012042805A12012-04-05
WO2012042804A12012-04-05
Foreign References:
US9012872B12015-04-21
Attorney, Agent or Firm:
KOYO INTERNATIONAL PATENT FIRM (JP)
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