SURFACE PLASMON RESONANCE SENSOR USING BEAM PROFILE ELLIPSOMETRY

WIPO Patent Application WO/2010/062150

A3

Provided is a multi-channel surface plasmon resonance sensor using beam profile ellipsometry; and, more particularly, to a high sensitive measuring technology, which is coupled with a vertical illumination type focused-beam ellipsometer using a multi-incident angle measurement method, and a surface plasmon resonance (SPR) sensing part deposited with a metal thin film. The multi-channel surface plasmon resonance sensor includes a vertical illumination type focused-beam ellipsometer, in which light is polarized; a surface plasmon resonance (SPR) sensing part which is provided at the objective lens part of the focused-beam ellipsometer so as to generate SPR according to an angle change of the polarized light; and a flow unit which supplies a buffer solution containing a bio material binding to or dissociation from the metal thin film generating surface plasmon, wherein the SPR and the ellipsometric phase change by change in an angle and a wavelength are simultaneously detected.

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CHO HYUN MO (KR)
CHO YONG JAI (KR)
CHEGAL WON (KR)

PCT/KR2009/007084

September 10, 2010

November 30, 2009

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KOREA RES INST OF STANDARDS (KR)
CHO HYUN MO (KR)
CHO YONG JAI (KR)
CHEGAL WON (KR)

G01N21/55; G01N21/00; G01N21/25

KR100742982B1	2007-07-26
KR100788313B1	2007-12-28
US20080032326A1	2008-02-07
US20060221343A1	2006-10-05

KWON, Oh-Sig et al. (921 Dunsan-dong Seo-gu, Daejeon 302-120, KR)

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