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Patent Searching and Data


Title:
SURFACE ROUGHNESS TESTER
Document Type and Number:
WIPO Patent Application WO/2007/066659
Kind Code:
A1
Abstract:
[PROBLEMS] To provide a surface roughness tester for adequately testing a surface of an object under test even if the surface is a curved one. [MEANS FOR SOLVING PROBLEMS] A surface roughens tester comprises an imaging unit (20) having a line sensor (22) to scan the surface (101) of an object to under test in a direction perpendicular to the length direction of the line sensor (22) and thereby to allow the line sensor (22) to output a gray-scale signal from each pixel and a processing unit (50) for processing the gray-scale signal. The processing unit (50) has means (S2) for acquiring a pixel gray-scale level from the gray-scale signal and gray-scale state generating means (S7) for generating gray-scale state information Pf representing the gray-scale state in the direction in which the line sensor (22) scans the object surface from the gray-scale levels of all the pixels over the object surface (101).

Inventors:
HAYASHI YOSHINORI (JP)
MORI HIDEKI (JP)
Application Number:
PCT/JP2006/324264
Publication Date:
June 14, 2007
Filing Date:
December 05, 2006
Export Citation:
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Assignee:
SHIBAURA MECHATRONICS CORP (JP)
HAYASHI YOSHINORI (JP)
MORI HIDEKI (JP)
International Classes:
H01L21/66; G01B11/30; G01N21/956
Foreign References:
JP2004301847A2004-10-28
JPH07270144A1995-10-20
JPH11351850A1999-12-24
JP2002365234A2002-12-18
JPS63106546A1988-05-11
Other References:
See also references of EP 1959487A4
Attorney, Agent or Firm:
HIGUCHI, Masaki (1-4-3 Sengencho, Nishi-ku, Yokohama-sh, Kanagawa 72, JP)
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