Title:
SWING ANALYZING DEVICE, PROGRAM FOR CAUSING COMPUTER TO ANALYZE SWING, AND SWING ANALYZING SYSTEM
Document Type and Number:
WIPO Patent Application WO/2018/084295
Kind Code:
A1
Abstract:
This swing analyzing device (10): receives an input of acceleration information and angular velocity information detected by means of a sensor (20) attached to an object of detection; computes attitude information of the object of detection by applying a first filter to the acceleration information and the angular velocity information; corrects the attitude information of the object of detection during a swing period on the basis of the attitude information of the object of detection at a first time point in the swing period; performs coordinate conversion on the basis of the corrected attitude information to convert the acceleration information from a sensor coordinate system to an absolute coordinate system; computes a first velocity by time-integrating the coordinate-converted acceleration information in accordance with the passage of time; computes a second velocity by time-integrating the coordinate-converted acceleration information by going back in time from a motion feature point at which the velocity of the object of detection is zero or close to zero; and computing a swing velocity of the object of detection by applying a second filter to the first velocity and the second velocity.
Inventors:
NARUO TAKESHI (JP)
SHIMIZU YUICHI (JP)
SHIBATA SHOHEI (JP)
HIROSE KIYOSHI (JP)
SHIMIZU YUICHI (JP)
SHIBATA SHOHEI (JP)
HIROSE KIYOSHI (JP)
Application Number:
PCT/JP2017/039990
Publication Date:
May 11, 2018
Filing Date:
November 06, 2017
Export Citation:
Assignee:
MIZUNO KK (JP)
UNIV AKITA (JP)
UNIV AKITA (JP)
International Classes:
A63B69/00
Domestic Patent References:
WO2015164944A1 | 2015-11-05 |
Foreign References:
JP2016055028A | 2016-04-21 | |||
JP2012120579A | 2012-06-28 | |||
JP2016158699A | 2016-09-05 | |||
JP2015013007A | 2015-01-22 | |||
JP2014054483A | 2014-03-27 | |||
JP3160720U | 2010-07-08 |
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (JP)
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