Title:
SYSTEM ANALYSIS DEVICE, SYSTEM ANALYSIS METHOD, AND PROGRAM RECORDING MEDIUM
Document Type and Number:
WIPO Patent Application WO/2017/213063
Kind Code:
A1
Abstract:
Provided is a system analysis device capable of calculating a degree of contribution of a variation pattern of time-series data to a change in the system state in consideration of time dependency and spatial dependency. Such a system analysis device 10 comprises: a detection unit 11 for detecting, as a rule, a combination of observed values which are included in multiple sets of time-series data on observed values, that is, values representing indices observed while the system is operating, and which satisfy a predetermined condition; and a calculation unit 12 for calculating the degree of contribution of the detected rule to a change in the system state.
Inventors:
MIZOGUCHI TAKEHIKO (JP)
Application Number:
PCT/JP2017/020749
Publication Date:
December 14, 2017
Filing Date:
June 05, 2017
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G06F17/30
Foreign References:
| JP2016058027A | 2016-04-21 | |||
| JP2016057923A | 2016-04-21 |
Attorney, Agent or Firm:
SHIMOSAKA Naoki (JP)
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