Title:
SYSTEM FOR CONTROLLING PROFILING OPERATION IN ARBITRARY DIRECTION
Document Type and Number:
WIPO Patent Application WO/1987/000784
Kind Code:
A1
Abstract:
In a system for controlling a profiling operation in an arbitrary direction, in which a model and a tracer head are moved relatively at an arbitrary angle with respect to a reference axis X, a reference point K is determined with respect to the model, and first and second profiling borders L1, L2 at which the profiling operation is turned back are determined, the profiling direction being always set on the radial lines a-b, c-d, e-f, g-h extending from the reference point K. Predetermined quantities of pick feed operations b-c, f-g are carried out on the profiling borders L1, L2 so as to make profiling feed actions always in the direction which is at right angles to the curved surfaces of the model, whereby the curved surfaces can be profiled with a high accuracy.
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Inventors:
YAMAZAKI ETUO (JP)
MATSUURA HITOSHI (JP)
MATSUURA HITOSHI (JP)
Application Number:
PCT/JP1986/000403
Publication Date:
February 12, 1987
Filing Date:
August 06, 1986
Export Citation:
Assignee:
FANUC LTD (JP)
International Classes:
B23Q35/48; B23Q33/00; B23Q35/123; (IPC1-7): B23Q35/48; B23Q33/00
Foreign References:
JPH06119547A | 1994-04-28 | |||
JPS55106753A | 1980-08-15 |
Other References:
See also references of EP 0231396A1
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