Title:
SYSTEM FOR DETERMINING DEFECT IN DISPLAY PANEL ON BASIS OF MACHINE LEARNING MODEL
Document Type and Number:
WIPO Patent Application WO/2022/158628
Kind Code:
A1
Abstract:
A system for determining a defect in a display panel on the basis of a machine learning model, according to the present invention, comprises: an optical inspector which obtains image information about whether a display panel is defective, by using a lighting inspection method, and classifies the obtained image information into one of a plurality of defect patterns; and a defect determiner which determines whether the display panel is defective, by applying the obtained image information to a machine learning model, corresponding to the classified defect pattern, among machine learning models respectively corresponding to the plurality of defect patterns.
Inventors:
KIM TAE SUNG (KR)
JANG SAE IL (KR)
YUN BYOUNG KOOK (KR)
PARK NAM JAE (KR)
KIM MI JIN (KR)
LEE JI SEOB (KR)
JANG SAE IL (KR)
YUN BYOUNG KOOK (KR)
PARK NAM JAE (KR)
KIM MI JIN (KR)
LEE JI SEOB (KR)
Application Number:
PCT/KR2021/001071
Publication Date:
July 28, 2022
Filing Date:
January 27, 2021
Export Citation:
Assignee:
SOLUTION A INC (KR)
International Classes:
G01N21/88; G06N3/08; G06N20/20
Foreign References:
| JP3002325B2 | 2000-01-24 | |||
| KR20190143192A | 2019-12-30 | |||
| KR101797402B1 | 2017-11-15 | |||
| KR20200039047A | 2020-04-16 | |||
| KR20190063839A | 2019-06-10 |
Attorney, Agent or Firm:
YOON, Jae Seung (KR)
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